APPLIED OPTICS

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                    [ArticleID] => 176596
                    [Title] => Pinoy physicists develop way to detect IC defects
                    [Summary] => Detecting faulty integrated circuits (IC) could now become a less expensive procedure through a cutting-edge technology developed by a team of physicists led by Dr. Caesar Saloma of the National Institute of Physics of the University of the Philippines Diliman.


The advanced technique produces high-contrast, layer-by-layer images of semiconductor sites in the ICs by combining the capabilities of a reflectance laser confocal microscope with single-photon, optical beam-induced current (1P-OBIC) imaging. 


                    [DatePublished] => 2002-09-19 00:00:00
                    [ColumnID] => 133272
                    [Focus] => 0
                    [AuthorID] => 
                    [AuthorName] => 
                    [SectionName] => Science and Environment
                    [SectionUrl] => science-and-environment
                    [URL] => 
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Pinoy physicists develop way to detect IC defects

September 19, 2002 - 12:00am

Detecting faulty integrated circuits (IC) could now become a less expensive procedure through a cutting-edge technology developed by a team of physicists led by Dr. Caesar Saloma of the National Institute of Physics...

Science and Environment